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CAT28F512
SUPPLY CHARACTERISTICS
Limits
Symbol
V CC
V PPL
V PPH
Parameter
V CC Supply Voltage
V PP During Read Operations
V PP During Read/Erase/Program
Min
4.5
0
11.4
Max.
5.5
6.5
12.6
Unit
V
V
V
A.C. CHARACTERISTICS, Read Operation
V CC = +5V ± 10%, unless otherwise specified.
JEDEC Standard
28F512-90
28F512-12 28F512-15
Symbol
Symbol
Parameter
Min. Max.
Min. Max. Min. Max. Unit
t AVAV
t ELQV
t AVQV
t GLQV
t AXQX
t RC
t CE
t ACC
t OE
t OH
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
Output Hold from Address OE / CE Change
90
0
90
90
35
120
0
120
120
50
150
0
150
150
55
ns
ns
ns
ns
ns
t GLQX
t OLZ(1)(6) OE to Output in Low-Z
0
0
0
ns
t ELQX
t GHQZ
t EHQZ
t WHGL(1)
t LZ(1)(6)
t DF(1)(2)
t DF(1)(2)
-
CE to Output in Low-Z
OE High to Output High-Z
CE High to Output High-Z
Write Recovery Time Before Read
0
6
20
30
0
6
30
40
0
6
35
45
ns
ns
ns
μ s
Figure 1. A.C. Testing Input/Output Waveform (3)(4)(5)
2.4 V
INPUT PULSE LEVELS
0.45 V
Figure 2. A.C. Testing Load Circuit (example)
2.0 V
0.8 V
1.3V
REFERENCE POINTS
1N914
3.3K
DEVICE
UNDER
TEST
CL = 100 pF
OUT
CL INCLUDES JIG CAPACITANCE
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V.
(5) Input and Output Timing Reference = 0.8V and 2.0V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
? 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
5
Doc. No. MD-1084, Rev. K
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